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Strategies to Manage Obsolescence in Aerospace and Defense https://www.ni.com/webcast/4585/en/
This webinar is for test engineers and test engineering leaders who are responsible for designing and maintaining manufacturing and maintenance test systems.

Top Challenges of 5G Wideband Test - Webinar https://www.ni.com/webcast/4578/en/
Designing and testing wideband 5G ICs will require engineers to reduce measurement uncertainty, test time, and cost. This webinar synthesizes the biggest test challenges of wideband 5G devices operating ...

Wireless Communications in the Internet of Underground Things https://www.ni.com/webcast/4561/en/
Researchers around the world are pushing the boundaries of discovery. Driven by the grand challenges, they are revolutionizing research in wireless communications, transportation, and energy. NI has worked ...

Ideal Solutions to Rapidly Design, Prototype, and Deploy Aerospace and Defense RF Applications https://www.ni.com/webcast/4553/en/
Modern RF systems serve a wide range of aerospace and defense applications, from adaptive radar and real-time spectrum analysis for electronic countermeasures to higher-bandwidth, smarter, and more secure ...

FPGA-Based Digital Interfacing for Design Verification and Production Test with NI Tools https://www.ni.com/webcast/4552/en/
Learn about the advantages of using FPGAs for implementing digital interfacing in your automated test systems, and see how using commercial off-the-shelf FPGA modules can mitigate the risk and cost of ...

What to Expect at Mobile World Congress (MWC) https://www.ni.com/video/4516/en/
James Kimery delivers a short preview of what to expect at MWC.

Addressing the Challenges of mmWave Measurements Webinar https://www.ni.com/webcast/4498/en/
Learn about some of the biggest challenges of 5G test, particularly those associated with testing milimeterwave (mmWave) products. In addition to gaining an overview of 5G technology and timelines, explore ...

Fast Sampling with Isolated Digitizer Mode https://www.ni.com/video/4306/en/
Learn how to use LabVIEW and the NI-DMM API to programmatically adjust the sampling rate of PXI digital multimeters (DMM). With excellent measurement quality and sampling rates of up to 1.8 MS/s, PXI DMMs ...

Using Digital Pattern Test Code Modules in TestStand Semiconductor Module https://www.ni.com/video/4312/en/
Learn how to use the TestStand Semiconductor Module to programmatically call and sequence code modules developed in LabVIEW to burst digital patterns on the PXI digital pattern instrument. The TestStand ...

Hardware-Timed Sequences with PXI Source Measure Unit https://www.ni.com/video/4298/en/
Learn how to use LabVIEW and the NI-DCPOWER API to perform hardware timed sequences with a PXI source measure unit (SMU). Hardware-timed sequences remove the communication latency between the host computer ...