Case Study Results
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Real-Time Defects Mapping on Integrated Circuits Using NI PXI and LabVIEW FPGA
Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, ...
sine.ni.com/cs/app/doc/p/id/cs-14446
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Using LabVIEW and PXI Express to Develop a High-Accuracy Process Control and Data Recording System for a Stand-Alone Vacuum Reactor
Designing and controlling a reactor for semiconductor research and manufacturing processes that adds controlled quantities of a chemical at a predetermined temperature, ...
sine.ni.com/cs/app/doc/p/id/cs-14182
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ST-Ericsson Reduces Semiconductor Test Time 10X Using LabVIEW and NI PXI RF Instruments
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.
sine.ni.com/cs/app/doc/p/id/cs-14361
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Structural and Memory Testing of Ultra-Low-Power ASIC Designs Using PXI Modular Instruments
Creating a flexible test system to automatically verify and characterize new ultra-low-power semiconductor chip designs.
sine.ni.com/cs/app/doc/p/id/cs-13631
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Creating an Automated Microcontroller Test System Using LabVIEW and FPGA
"With NI products, we can easily test various microcontroller peripherals with a single hardware and software solution. We used NI products to automate our testing ...
sine.ni.com/cs/app/doc/p/id/cs-13557
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ST-Ericsson Manages Communication Protocols With FPGA RF Instrumentation Based on NI FlexRIO
Implementing an autonomous, scalable, programmable instrument to manage digital communication protocols in an automated test solution.
sine.ni.com/cs/app/doc/p/id/cs-13440
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Characterisation of an LED-Based Micro-Optical Encoder
Building a 2D scanning system to study the light emitted by micro-optoelectromechanical systems (MOEMS) for optical encoders, which are devices that take high-precision ...
sine.ni.com/cs/app/doc/p/id/cs-13014
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Analog Devices Reduces MEMS Test Costs with PXI and LabVIEW
Developing an efficient, cost-effective, and compact system for MEMS testing in characterization and production.
sine.ni.com/cs/app/doc/p/id/cs-13005
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Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software
Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); ...
sine.ni.com/cs/app/doc/p/id/cs-12999
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Prototyping an Electric Buggy with LabVIEW and CompactRIO
Transforming a gas-powered buggy into an electric buggy to create a fun way for students to learn the principles of real-time command, control, and supervision.
sine.ni.com/cs/app/doc/p/id/cs-13378
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Case Study Results
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