Case Study Results

Showing 1-10 of 16 results
Developing an Innovative, Scalable Audio Test System Using LabVIEW and NI DAQ Hardware www.ni.com/en-us/innovations/case-studies/19/developing-an-innovative-scalable-audio-test-system.html
Creating a scalable sound optimization system to test sound quality, which is increasingly constrained by smaller, thinner devices and strict power consumption requirements.

High-Voltage, Time-Dependent Dielectric Breakdown System for the IEC 60747-17 Standard www.ni.com/en-us/innovations/case-studies/19/high-voltage-time-dependent-dielectric-breakdown-system.html
INTEK needed to invent and build a fully automatic measurement system that could test up to 50 magnetic couplers simultaneously while they are subjected to a high voltage (up to 8 kV rms) and placed in ...

Going Beyond the Sensor: Peratech’s Force Test Technology to Deliver High-Quality Sensors www.ni.com/en-us/innovations/case-studies/19/going-beyond-the-sensor-peratechs-force-test-technology-to-deliver-high-quality-sensors.html
Force sensing solutions help device makers create more natural, intuitive, and immersive user experiences for those using their kits. Measuring and utilising the analogue, non-linear output from force ...

Fully Automated Test System for LV124/LV148 Reduces Test Times and Costs for Lidar Electrical Testing by 50 Percent www.ni.com/en-us/innovations/case-studies/19/fully-automated-test-system-for-lv124-lv148-reduces-test-times-and-costs-for-lidar-electrical-testing-by-50-percent.html
We needed to develop a fully automated test system for the electrical tests of the LV124 automotive standard. We wanted to replace the usual manual test procedure and drastically reduce the test time and ...

Autonomous High-Current Circuit Breaker Testing System www.ni.com/en-us/innovations/case-studies/19/autonomous-high-current-circuit-breaker-testing-system.html
Making electrical tests and mechanical tests for circuit breakers less labour intensive and less time consuming as current methods are run in large quantities and can last for hours.

Increasing Parallelism, Automation, and Standardization to Reduce Post-Silicon Characterization Time by Over 60% sine.ni.com/cs/app/doc/p/id/cs-17714
At Cypress Semiconductor Corp., we had to reduce the turnaround time for the bench characterization of diverse System-on-Chip (SoC) products designed and developed at different Cypress centers in Asia ...

High-Voltage, Time-Dependent Dielectric Breakdown System for the IEC 60747-17 Standard sine.ni.com/cs/app/doc/p/id/cs-17687
INTEK needed to invent and build a fully automatic measurement system that could test up to 50 magnetic couplers simultaneously while they are subjected to a high voltage (up to 8 kV rms) and placed in ...

Development of Systems for Technical Training in the Field of Physics sine.ni.com/cs/app/doc/p/id/cs-17635
EDIBON needed to develop teaching units to drive the learning of the principles, techniques, technologies, and applications of physics, both at the industrial and research levels.

Universal SRAM Test System Based on NI PXI Solutions sine.ni.com/cs/app/doc/p/id/cs-17592
We needed a turnkey solution for the functional test of static random access memories (SRAMs) that could support a wide range of memory models (more than 2,000). The solutions needed to be expandable, ...

Accelerating Research Innovation: Teaching LabVIEW at a Centre of Doctoral Training sine.ni.com/cs/app/doc/p/id/cs-17473
Postgraduate research students join the Centre of Doctoral Training with varying levels of programming experience and from a wide variety of backgrounds, including mechanical engineering, physics, and ...