Case Study Results

Showing 1-10 of 20 results
Automated Test System for High-Power IBGT and MOSFET Transistors www.ni.com/en-us/innovations/case-studies/19/automated-test-system-for-high-power-ibgt-and-mosfet-transistors.html
Designing an automated test system for functional and parametric control of static and dynamic parameters of high-power IGBT and MOSFET transistors.

Qualcomm Atheros Improves WLAN Test Speed by 200X www.ni.com/en-us/innovations/case-studies/19/qualcomm-atheros-improves-wlan-test-speed.html
Keeping wireless local area network (WLAN) test costs low and test accuracy high while reducing characterization times as device complexity grows by tracking an increasing number of wireless standards. ...

Building a Software Automation Framework to Drive Standardization and Increase Efficiency in Semiconductor Post-Silicon Validation Engineering www.ni.com/en-us/innovations/case-studies/19/vision-system-for-3d-model-reconstruction-using-low-price-hardware-components-and-structured-light-reconstruction-algorithms-in-labview1.html
Establishing an effective mechanism to share measurement expertise and device, and instrumentation knowledge across validation teams to facilitate accelerated product development and validation cycles ...

Building a Software Automation Framework to Drive Standardization and Increase Efficiency in Semiconductor Post-Silicon Validation Engineering www.ni.com/en-us/innovations/case-studies/19/building-a-software-automation-framework-to-drive-standardization-increase-efficiency-in-semiconductor-post-silicon-validation-engineering.html
Establishing an effective mechanism to share measurement expertise and device, and instrumentation knowledge across validation teams to facilitate accelerated product development and validation cycles ...

Parametric Test for Next-Generation Semiconductor Technologies www.ni.com/en-us/innovations/case-studies/19/parametric-test-for-next-generation-semiconductor-technologies.html
Performing accurate electrical wafer-level tests in the semiconductor R&D fabrication (fab) process flow to detect process-related issues at an early stage, which would help us to rework the wafers at ...

ON Semiconductor Speeds Up Test Times With the Semiconductor Test System www.ni.com/en-us/innovations/case-studies/19/on-semiconductor-speeds-up-test-times-with-the-semiconductor-test-system.html
Developing a high-end, scalable, and cost-effective mixed-signal automated test equipment (ATE) production tester that enables wafer sort and final test for ON Semiconductor’s new generation image sensors. ...

Probing of Large-Array, Fine-Pitch Microbumps for 3D ICs www.ni.com/en-us/innovations/case-studies/19/probing-of-large-array-fine-pitch-microbumps-for-3d-ics.html
Performing die tests prior to stacking 3D ICs to achieve sufficient compound stack yield by probing the interconnect microbumps for pre-bond test access.

Increasing Parallelism, Automation, and Standardization to Reduce Post-Silicon Characterization Time by Over 60% www.ni.com/en-us/innovations/case-studies/19/increasing-parallelism-automation-and-standardization-to-reduce-post-silicon-characterization-time.html
At Cypress Semiconductor Corp., we had to reduce the turnaround time for the bench characterization of diverse System-on-Chip (SoC) products designed and developed at different Cypress centers in Asia ...

Semiconductor Carrier Profiling at Sub-10 nm Lithography Nodes www.ni.com/en-us/innovations/case-studies/19/semiconductor-carrier-profiling-at-sub-10-nm-lithography-nodes.html
NewPath Research needed to develop a system for non-destructive, high-resolution carrier profiling with sub-nm resolution to support the semiconductor industry as it progresses to the new sub-10 nm lithography ...

Building a Software Automation Framework to Drive Standardization and Increase Efficiency in Semiconductor Post-Silicon Validation Engineering www.ni.com/en-us/innovations/case-studies/19/building-a-software-automation-framework-to-drive-standardization-and-increase-efficiency-in-semiconductor-post-silicon-validation-engineering.html
Establishing an effective mechanism to share measurement expertise and device, and instrumentation knowledge across validation teams to facilitate accelerated product development and validation cycles ...