Case Study Results

Showing 1-10 of 33 results
PXI-Based Automated Wafer Probe Tester https://www.ni.com/en-us/innovations/case-studies/19/pxi-based-automated-wafer-probe-tester.html
Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

ST-Ericsson Reduces Semiconductor Test Time by 10X With LabVIEW and NI PXI RF Tools https://www.ni.com/en-us/innovations/case-studies/19/st-ericsson-reduces-semiconductor-test-time-by-10x-with-labview.html
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.

Using LabVIEW and PXI for an Automated Test Bench for High-Resolution Audio Test https://www.ni.com/en-us/innovations/case-studies/19/using-labview-and-pxi-for-an-automated-test-bench.html
Designing a test bench for an automated high-resolution audio codec that integrates analog-to-digital converters and digital-to-analog multichannel converters.

Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software https://www.ni.com/en-us/innovations/case-studies/19/texas-instruments-increases-firmware-test-platform-throughput-coverage-and-reliability.html
Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, ...

NI TestStand Provides the Framework to Texas Instruments $4 Billion Division https://www.ni.com/en-us/innovations/case-studies/19/ni-teststand-provides-the-framework-to-texas-instruments-4-billion-dollar-division.html
Characterizing Texas Instruments (TI) increasingly complex wireless and RF devices in a global design environment.

Qorvo Reduces Characterization Time of RF Power Amplifiers https://www.ni.com/en-us/innovations/case-studies/19/qorvo-reduces-characterization-time-of-rf-power-amplifiers.html
Reducing the characterization time of increasingly complex cellular power amplifiers (PAs) without sacrificing measurement accuracy or incurring higher capital equipment costs.

Structural and Memory Testing of Ultra-Low-Power ASIC Designs Using PXI Modular Instruments https://www.ni.com/en-us/innovations/case-studies/19/structural-and-memory-testing-of-ultra-low-power-asic-designs.html
Creating a flexible test system to automatically verify and characterize new ultra-low-power semiconductor chip designs.

Worldwide Standardization of Semiconductor Characterization Test at Melexis https://www.ni.com/en-us/innovations/case-studies/19/worldwide-standardization-of-semiconductor-characterization-test-at-melexis.html
Implementing a global semiconductor validation test strategy to improve test consistency, test coverage, and quality of statistical analysis to decrease the time to market and the effective time spend ...

Generic PXI-Based Application Board Tester https://www.ni.com/en-us/innovations/case-studies/19/generic-pxi-based-application-board-tester.html
Creating a system to automate application board testing, improving time to market, reducing cost, and giving Analog Devices, Inc. (ADI) a competitive advantage.

IDT Lowers Cost of Test Using the NI Semiconductor Test System https://www.ni.com/en-us/innovations/case-studies/19/idt-lowers-cost-of-test-using-the-ni-semiconductor-test-system.html
Keeping pace with continuously increasing test performance requirements in a fast moving environment where device performance is constantly pushing the limits of ATE system capabilities and thereby accelerating ...