Case Study Results

Showing 1-10 of 33 results
PXI-Based Automated Wafer Probe Tester
Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

ST-Ericsson Reduces Semiconductor Test Time by 10X With LabVIEW and NI PXI RF Tools
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.

Using LabVIEW and PXI for an Automated Test Bench for High-Resolution Audio Test
Designing a test bench for an automated high-resolution audio codec that integrates analog-to-digital converters and digital-to-analog multichannel converters.

Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software
Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, ...

NI TestStand Provides the Framework to Texas Instruments $4 Billion Division
Characterizing Texas Instruments (TI) increasingly complex wireless and RF devices in a global design environment.

Qorvo Reduces Characterization Time of RF Power Amplifiers
Reducing the characterization time of increasingly complex cellular power amplifiers (PAs) without sacrificing measurement accuracy or incurring higher capital equipment costs.

Structural and Memory Testing of Ultra-Low-Power ASIC Designs Using PXI Modular Instruments
Creating a flexible test system to automatically verify and characterize new ultra-low-power semiconductor chip designs.

Worldwide Standardization of Semiconductor Characterization Test at Melexis
Implementing a global semiconductor validation test strategy to improve test consistency, test coverage, and quality of statistical analysis to decrease the time to market and the effective time spend ...

Generic PXI-Based Application Board Tester
Creating a system to automate application board testing, improving time to market, reducing cost, and giving Analog Devices, Inc. (ADI) a competitive advantage.

IDT Lowers Cost of Test Using the NI Semiconductor Test System
Keeping pace with continuously increasing test performance requirements in a fast moving environment where device performance is constantly pushing the limits of ATE system capabilities and thereby accelerating ...