Case Study Results

Showing 1-10 of 37 results
Shining Technologies Create a LED Multi-Site LED Tester Using NI PXIe-4137 to Test LED Five Times Faster www.ni.com/en-us/innovations/case-studies/19/shining-technologies-create-a-led-multi-site-led-tester-using-ni-pxie-4137-to-test-led-five-times-faster.html
Falling price forces LED manufacturers to look for a higher-yield, lower-cost tester but need to be able to cover the same test plan and to maintain the measurement accuracy.

Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software www.ni.com/en-us/innovations/case-studies/19/texas-instruments-increases-firmware-test-platform-throughput-coverage-and-reliability.html
Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, ...

Using LabVIEW and PXI for an Automated Test Bench for High-Resolution Audio Test www.ni.com/en-us/innovations/case-studies/19/using-labview-and-pxi-for-an-automated-test-bench.html
Designing a test bench for an automated high-resolution audio codec that integrates analog-to-digital converters and digital-to-analog multichannel converters.

Worldwide Standardization of Semiconductor Characterization Test at Melexis www.ni.com/en-us/innovations/case-studies/19/worldwide-standardization-of-semiconductor-characterization-test-at-melexis.html
Implementing a global semiconductor validation test strategy to improve test consistency, test coverage, and quality of statistical analysis to decrease the time to market and the effective time spend ...

Fraunhofer Reduces Test Time by 6X for Wafer-Level MEMs Inertial Sensors www.ni.com/en-us/innovations/case-studies/19/fraunhofer-reduces-test-time-by-6x-for-wafer-level-mems-inertial-sensors.html
Reducing the test time, test system footprint, and overall cost for final-stage wafer- level testing of microelectromechanical systems (MEMs) inertial sensors while maintaining measurement quality.

G Systems Designs Flexible Semiconductor Test Executive with LabVIEW and NI TestStand www.ni.com/en-us/innovations/case-studies/19/g-systems-designs-flexible-semiconductor-test-executive-with-labview-and-ni-teststand.html
Designing and implementing a custom functional test system for producing many types of semiconductor hybrids. The system should provide a flexible test architecture, easy-to-use development environment, ...

Multichannel Frequency Synthesizer ATE System www.ni.com/en-us/innovations/case-studies/19/multichannel-frequency-synthesizer-ate-system.html
Design, develop, and deploy a flexible and precise automated test equipment (ATE) system for a 6-channel tunable and a 4-channel fixed-frequency synthesizer.

PXI-Based Automated Wafer Probe Tester www.ni.com/en-us/innovations/case-studies/19/pxi-based-automated-wafer-probe-tester.html
Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

Developing a Versatile Test System to Reduce Semiconductor Cost of Test www.ni.com/en-us/innovations/case-studies/19/developing-a-versatile-test-system-to-reduce-semiconductor-cost-of-test.html
Identifying a cost effective solution for performing fixture test and repair in line with manufacturing flow that requires minimum overhead and does not affect ATE productivity.

Generic PXI-Based Application Board Tester www.ni.com/en-us/innovations/case-studies/19/generic-pxi-based-application-board-tester.html
Creating a system to automate application board testing, improving time to market, reducing cost, and giving Analog Devices, Inc. (ADI) a competitive advantage.