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Designing Next-Generation Test Systems
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-431
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Exploring Effective Calibration and Sparing Strategies
Discover how an effective calibration and sparing strategy can minimize downtime costs and maximize automated test system productivity. This presentation is from ...
zone.ni.com/wv/app/doc/p/id/wv-1461
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What is Hardware-in-the-Loop (HIL) Testing
NI Home Overview Understand how HIL testing improves control system validation. View Now (watch) 9 minute(s) webcast Requires: Adobe Flash Please disable your browser's ...
zone.ni.com/wv/app/doc/p/id/wv-1792
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Head-to-Head Instrument Control Bus Comparison: GPIB, PCI, PCI Express, USB, and Ethernet/LAN
You can choose from a variety of instrumentation buses for test and measurement. View this webcast to compare the technical merits and relative strengths of PCI, ...
zone.ni.com/wv/app/doc/p/id/wv-183
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Build an ATE from Scratch
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-429
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Bus Technologies for Test and Measurement Systems
This tutorial discusses the technical merits of several bus and platform technologies for use in test and measurement, including GPIB, VME, PCI, USB, Ethernet, and ...
zone.ni.com/wv/app/doc/p/id/wv-191
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PXI 101: Introduction to the PXI Platform
In this technical webcast on-demand, learn about PXI—the PC-based platform optimized for test, measurement, and control. Discover the advantages of using PXI over ...
zone.ni.com/wv/app/doc/p/id/wv-199
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Retrofitting Rack-Mount-Based ATEs Using PXI Modules as Virtual Instrumentation
Presented by Ehud Shany, President/CEO, WinSoft Inc. Legacy and existing test and measurement instruments exhibit end-of-life problems such as lack of replacement ...
zone.ni.com/wv/app/doc/p/id/wv-198
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Best Practices for Incorporating New Measurements into a Test System
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-428
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Improve System Performance with Next-Generation Technologies
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-430
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| Operator | Example | Action | Boolean Equivalent |
|---|---|---|---|
| " " | "temperature monitoring" | Requires two terms to be adjacent to each other. In this example, only documents containing the phrase "temperature monitoring" will be shown. | ADJ |
| + | +temperature | Requires this term to be present as-is, eliminating the use of synonyms. This search query can be used in conjunction with other keywords to find only documents containing the word "temperature". | AND |
| - | -monitoring | Excludes results containing this term. Use this query in conjunction with other terms to find only documents not containing the word "monitoring" | NOT |
| () | (temperature monitoring) | Allows terms to be grouped when used with other operators. For example, searing for industrial -(temperature monitoring) will return only documents containing "industrial" but not "temperature" or "monitoring" | OR |
| * | monitor* | Acts as a wildcard. This example will return documents containing words "monitor", "monitoring", "monitored", etc | n/a |