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5 Challenges of 5G Wideband Test www.ni.com/webcast/4578/en/
Designing and testing wideband 5G ICs will require engineers to reduce measurement uncertainty, test time, and cost. This webinar synthesizes the biggest test challenges of wideband 5G devices operating ...

Wireless Communications in the Internet of Underground Things www.ni.com/webcast/4561/en/
Researchers around the world are pushing the boundaries of discovery. Driven by the grand challenges, they are revolutionizing research in wireless communications, transportation, and energy. NI has worked ...

FPGA-Based Digital Interfacing for Design Verification and Production Test with NI Tools www.ni.com/webcast/4552/en/
Learn about the advantages of using FPGAs for implementing digital interfacing in your automated test systems, and see how using commercial off-the-shelf FPGA modules can mitigate the risk and cost of ...

Ideal Solutions to Rapidly Design, Prototype, and Deploy Aerospace and Defense RF Applications www.ni.com/webcast/4553/en/
Modern RF systems serve a wide range of aerospace and defense applications, from adaptive radar and real-time spectrum analysis for electronic countermeasures to higher-bandwidth, smarter, and more secure ...

What to Expect at Mobile World Congress (MWC) www.ni.com/video/4516/en/
James Kimery delivers a short preview of what to expect at MWC.

Addressing the Challenges of mmWave Measurements Webinar www.ni.com/webcast/4498/en/
Learn about some of the biggest challenges of 5G test, particularly those associated with testing milimeterwave (mmWave) products. In addition to gaining an overview of 5G technology and timelines, explore ...

Fast Sampling and Update Rate with PXI Source Measure Units www.ni.com/video/4301/en/
Learn how to use LabVIEW and the NI-DCPOWER API to programmatically adjust the sampling rate and update rate of PXI source measure units (SMU). With excellent measurement quality, PXI SMUs give you the ...

Digital Control of Rise Time with PXI Source Measure Units www.ni.com/video/4302/en/
Learn how to use LabVIEW and the NI-DCPOWER API to digitally control the transient properties of PXI source measure units (SMU) to maximize stability, reduce overshoot, and greatly reduce test times with ...

Debugging with the Digital Pattern Editor and PXI Digital Pattern Instrument www.ni.com/video/4310/en/
Learn how to use the Digital Pattern Editor and PXI Digital Pattern Instrument to debug digital test patterns and semiconductor devices. The Digital Pattern Editor features intuitive features, such as ...

Programmatically Bursting Digital Patterns with LabVIEW and PXI Digital Pattern Instrument www.ni.com/video/4311/en/
Learn how to use the Digital Pattern Editor, PXI Digital Pattern Instrument, and LabVIEW to programmatically burst digital patterns to test semiconductor devices. After configuring the digital pattern ...