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Strategies to Manage Obsolescence in Aerospace and Defense www.ni.com/webcast/4585/en/
This webinar is for test engineers and test engineering leaders who are responsible for designing and maintaining manufacturing and maintenance test systems.

Top Challenges of 5G Wideband Test - Webinar www.ni.com/webcast/4578/en/
Designing and testing wideband 5G ICs will require engineers to reduce measurement uncertainty, test time, and cost. This webinar synthesizes the biggest test challenges of wideband 5G devices operating ...

Wireless Communications in the Internet of Underground Things www.ni.com/webcast/4561/en/
Researchers around the world are pushing the boundaries of discovery. Driven by the grand challenges, they are revolutionizing research in wireless communications, transportation, and energy. NI has worked ...

FPGA-Based Digital Interfacing for Design Verification and Production Test with NI Tools www.ni.com/webcast/4552/en/
Learn about the advantages of using FPGAs for implementing digital interfacing in your automated test systems, and see how using commercial off-the-shelf FPGA modules can mitigate the risk and cost of ...

Ideal Solutions to Rapidly Design, Prototype, and Deploy Aerospace and Defense RF Applications www.ni.com/webcast/4553/en/
Modern RF systems serve a wide range of aerospace and defense applications, from adaptive radar and real-time spectrum analysis for electronic countermeasures to higher-bandwidth, smarter, and more secure ...

What to Expect at Mobile World Congress (MWC) www.ni.com/video/4516/en/
James Kimery delivers a short preview of what to expect at MWC.

Addressing the Challenges of mmWave Measurements Webinar www.ni.com/webcast/4498/en/
Learn about some of the biggest challenges of 5G test, particularly those associated with testing milimeterwave (mmWave) products. In addition to gaining an overview of 5G technology and timelines, explore ...

Debugging with the Digital Pattern Editor and PXI Digital Pattern Instrument www.ni.com/video/4310/en/
Learn how to use the Digital Pattern Editor and PXI Digital Pattern Instrument to debug digital test patterns and semiconductor devices. The Digital Pattern Editor features intuitive features, such as ...

Hardware-Timed Sequences with PXI Source Measure Unit www.ni.com/video/4298/en/
Learn how to use LabVIEW and the NI-DCPOWER API to perform hardware timed sequences with a PXI source measure unit (SMU). Hardware-timed sequences remove the communication latency between the host computer ...

Overview of NI-DCPOWER Interactive Soft Front Panel www.ni.com/video/4300/en/
Learn how to use the interactive NI-DCPOWER soft front panel for full out-of-the-box functionality of a PXI Source Measure Unit (SMU). This interactive soft front panel includes two modes: one for constantly ...