| What is Hardware-in-the-Loop (HIL) Testing
NI Home Overview Understand how HIL testing improves control system validation. View Now 9 minute(s) webcast Requires: Flash 9 Please disable your browser's pop-up ...
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| New Controller Options for VXI
The VXIbus has been a well-supported platform for instrumentation systems since its inception in 1987. Being an open industry standard, the VXIbus has been an ideal ...
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| Exploring Effective Calibration and Sparing Strategies
Discover how an effective calibration and sparing strategy can minimize downtime costs and maximize automated test system productivity. This presentation is from ...
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| Virtual Instrumentation
This document explains the concept of virtual instrumentation and explains why LabVIEW is the best tool to create virtual instruments.
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| Selecting Hard Drives for Test, Measurement, and Control Systems
The majority of today’s test, measurement, and control systems include at least one hard drive. This hard drive may reside in the desktop or laptop PC that is controlling ...
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| Increase Productivity with an Integrated Software Framework for Measurement and Automation
In an "ideal" world, a company would not need to test a product as it evolves from research to design and through production. However, the fact is that measurement ...
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| VME & PXI Platforms: A Comparison
The architecture of an embedded system depends on application needs, development environment choices and future requirements. With the current pace of innovation, ...
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| Configuring and Using Shared Memory from a National Instruments VXI//VME Bus Controller
This application note discusses configuring and using shared memory in your VXI or VME instrumentation systems. It includes code examples and troubleshooting tips. ...
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| Head-to-Head Instrument Control Bus Comparison: GPIB, PCI, PCI Express, USB, and Ethernet/LAN
You can choose from a variety of instrumentation buses for test and measurement. View this webcast to compare the technical merits and relative strengths of PCI, ...
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| Strategies for Lowering the Cost of Manufacturing Test
Overview Today’s electronics manufacturers face unprecedented cost and time-to-market pressures. As the complexity of electronics systems has rapidly increased and ...
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