|
Designing Next-Generation Test Systems
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-431
|
|
Virtual Instrumentation
This document explains the concept of virtual instrumentation and explains why LabVIEW is the best tool to create virtual instruments.
www.ni.com/white-paper/4752/en
|
|
National Instruments Product Compatibility for Microsoft Windows Vista
The following document outlines National Instruments Product Support for Windows Vista, The table lists the minimum version required to operate on the specific operating ...
www.ni.com/white-paper/6893/en
|
|
VME and PXI Platforms: A Comparison
The architecture of an embedded system depends on application needs, development environment choices, and future requirements. With the current pace of innovation, ...
www.ni.com/white-paper/5712/en
|
|
Exploring Effective Calibration and Sparing Strategies
Discover how an effective calibration and sparing strategy can minimize downtime costs and maximize automated test system productivity. This presentation is from ...
zone.ni.com/wv/app/doc/p/id/wv-1461
|
|
What is Hardware-in-the-Loop (HIL) Testing
NI Home Overview Understand how HIL testing improves control system validation. View Now (watch) 9 minute(s) webcast Requires: Adobe Flash Please disable your browser's ...
zone.ni.com/wv/app/doc/p/id/wv-1792
|
|
Head-to-Head Instrument Control Bus Comparison: GPIB, PCI, PCI Express, USB, and Ethernet/LAN
You can choose from a variety of instrumentation buses for test and measurement. View this webcast to compare the technical merits and relative strengths of PCI, ...
zone.ni.com/wv/app/doc/p/id/wv-183
|
|
Build an ATE from Scratch
Join test industry professionals for an online conference and exhibition detailing today's best practices in automated test systems design. This presentation is ...
zone.ni.com/wv/app/doc/p/id/wv-429
|
|
Increase Productivity with an Integrated Software Framework for Measurement and Automation
In an "ideal" world, a company would not need to test a product as it evolves from research to design and through production. However, the fact is that ...
www.ni.com/white-paper/3491/en
|
|
Deterministic Data Streaming in Distributed Data Acquisition Systems
For Aerospace design engineers who build high-performance data acquisition systems using the LabVIEW Real-Time Module, third party distributed shared memory is a ...
www.ni.com/white-paper/3245/en
|
| Operator | Example | Action | Boolean Equivalent |
|---|---|---|---|
| " " | "temperature monitoring" | Requires two terms to be adjacent to each other. In this example, only documents containing the phrase "temperature monitoring" will be shown. | ADJ |
| + | +temperature | Requires this term to be present as-is, eliminating the use of synonyms. This search query can be used in conjunction with other keywords to find only documents containing the word "temperature". | AND |
| - | -monitoring | Excludes results containing this term. Use this query in conjunction with other terms to find only documents not containing the word "monitoring" | NOT |
| () | (temperature monitoring) | Allows terms to be grouped when used with other operators. For example, searching for industrial -(temperature monitoring) will return only documents containing "industrial" but not "temperature" or "monitoring" | OR |
| * | monitor* | Acts as a wildcard. This example will return documents containing words "monitor", "monitoring", "monitored", etc | n/a |