| NI VeriStand Add-on - NI Fault Insertion Units
Add deterministic hardware fault insertion to NI VeriStand by using the example Custom Device to control the NI PXI-2510 Fault Insertion Unit (FIU).
|
|
| Output Voltage Level Testing Technical Details (VOH, VOL)
Overview This document will discuss the technical details of testing the voltage output thresholds of digital semiconductor devices using a test system created using ...
|
|
| Input Voltage Threshold (VIH, VIL) Testing Technical Details
Overview This document will discuss the technical details of testing the voltage input thresholds on semiconductor devices using a test system created with the PXI ...
|
|
| Output Short Circuit Testing Technical Details (IOSH, IOSL)
Overview This document will discuss the technical details of testing the output short circuit current of digital semiconductor devices using a test system created ...
|
|
| Input Leakage Testing Technical Details (IIL, IIH)
iOverview This document will discuss the technical details of testing the input leakage current on semiconductor devices using a test system created with the PXI ...
|
|
| Acquiring Waveform Data from an NI DMM in LabVIEW SignalExpress
The NI 407x line of DMMs is capable of performing waveform voltage and current acquisitions. However, there currently is not a step available in LabVIEW SignalExpress ...
|
|
| Sourcing 100 nA with 2 SMUs
This example program shows how to use a current divider circuit to obtain 100 nA with 10 nA steps using 2x PXI-4130 SMUs and a PXI-4071 DMM to verify the results
|
|
| Digital 64x64 Switch Matrix Reference Example for LabVIEW FPGA
Acts as a dynamic 64x64 bit digital switch matrix. Any of the 64 inputs can be connected to any of the outputs. A single input can drive multiple outputs. The matrix ...
|
|
| Configuring the DMM to Take Multiple Measurement Types in the Same Scan List
This example program allows you to perform different measurement types on different channels of a switch and to specify the range and resolution for a specific channel ...
|
|
| Combined Measurements with NI PXI Switch Modules and High Speed Digitizers
This example combines the NI PXI Switch modules and high-speed digitizers together in a single VI. Users can use any multiplexers in scanning mode with a PXI high-speed ...
|