Case Study Results

Showing 1-10 of 34 results
PXI-Based Automated Wafer Probe Tester
Increasing wafer probe test throughput and improving tester flexibility for use with various semiconductor sensors.

Qorvo Reduces Characterization Time of RF Power Amplifiers
Qorvo needed to sustainably meet manufacturing test deadlines for complex powertrain electronic control units (ECUs), while ensuring test times complied with throughput needs and a competitive cost of ...

Real-Time Defects Mapping on Integrated Circuits Using NI PXI and LabVIEW FPGA
Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, and digital values contained in registers), ...

Structural and Memory Testing of Ultra-Low-Power ASIC Designs Using PXI Modular Instruments
Creating a flexible test system to automatically verify and characterize new ultra-low-power semiconductor chip designs.

Texas Instruments Increases Firmware Test Platform Throughput, Coverage, and Reliability with NI Hardware and Software
Developing a modular test solution that is abstract, scalable, modular, and easy to use; supports test sequencing across hundreds of power management ICs (PMIC); and interacts with multiple instruments, ...

Using LabVIEW and PXI for an Automated Test Bench for High-Resolution Audio Test
Designing a test bench for an automated high-resolution audio codec that integrates analog-to-digital converters and digital-to-analog multichannel converters.

Shining Technologies Create a LED Multi-Site LED Tester Using NI PXIe-4137 to Test LED Five Times Faster
Falling price forces LED manufacturers to look for a higher-yield, lower-cost tester but need to be able to cover the same test plan and to maintain the measurement accuracy.

Worldwide Standardization of Semiconductor Characterization Test at Melexis
Implementing a global semiconductor validation test strategy to improve test consistency, test coverage, and quality of statistical analysis to decrease the time to market and the effective time spend ...

Analog Devices Reduces MEMS Test Costs with PXI and LabVIEW
Developing an efficient, cost-effective, and compact system for MEMS testing in characterization and production.

Automated Testing of Hardware-Dependent AUTOSAR MCAL software
Developing a system for automated testing of peripheral software that does not require considerable investment into a specialized test hardware infrastructure and does not require continuous upgrading ...