Case Study Results

Showing 1-10 of 36 results
Creating an Automated Microcontroller Test System Using LabVIEW and FPGA https://www.ni.com/en-us/innovations/case-studies/19/creating-an-automated-microcontroller-test-system-using-labview-and-fpga.html
Integrating and automating a complete microcontroller testing workflow.

Fraunhofer Reduces Test Time by 6X for Wafer-Level MEMs Inertial Sensors https://www.ni.com/en-us/innovations/case-studies/19/fraunhofer-reduces-test-time-by-6x-for-wafer-level-mems-inertial-sensors.html
Reducing the test time, test system footprint, and overall cost for final-stage wafer- level testing of microelectromechanical systems (MEMs) inertial sensors while maintaining measurement quality.

Generic PXI-Based Application Board Tester https://www.ni.com/en-us/innovations/case-studies/19/generic-pxi-based-application-board-tester.html
Creating a system to automate application board testing, improving time to market, reducing cost, and giving Analog Devices, Inc. (ADI) a competitive advantage.

Qorvo Reduces Characterization Time of RF Power Amplifiers https://www.ni.com/en-us/innovations/case-studies/19/qorvo-reduces-characterization-time-of-rf-power-amplifiers.html
Reducing the characterization time of increasingly complex cellular power amplifiers (PAs) without sacrificing measurement accuracy or incurring higher capital equipment costs.

Real-Time Defects Mapping on Integrated Circuits Using NI PXI and LabVIEW FPGA https://www.ni.com/en-us/innovations/case-studies/19/real-time-defects-mapping-on-integrated-circuits-using-ni-pxi-and-labview-fpga.html
Creating a system to localize failure mechanisms causing abnormal electrical behavior, including those linked to complex parameters (such as frequencies, amplitudes, and digital values contained in registers), ...

Structural and Memory Testing of Ultra-Low-Power ASIC Designs Using PXI Modular Instruments https://www.ni.com/en-us/innovations/case-studies/19/structural-and-memory-testing-of-ultra-low-power-asic-designs.html
Creating a flexible test system to automatically verify and characterize new ultra-low-power semiconductor chip designs.

Using LabVIEW and PXI for an Automated Test Bench for High-Resolution Audio Test https://www.ni.com/en-us/innovations/case-studies/19/using-labview-and-pxi-for-an-automated-test-bench.html
Designing a test bench for an automated high-resolution audio codec that integrates analog-to-digital converters and digital-to-analog multichannel converters.

Analog Devices Reduces MEMS Test Costs with PXI and LabVIEW https://www.ni.com/en-us/innovations/case-studies/19/analog-devices-reduces-mems-test-costs-with-pxi-and-labview.html
Developing an efficient, cost-effective, and compact system for MEMS testing in characterization and production.

IDT Lowers Cost of Test Using the NI Semiconductor Test System https://www.ni.com/en-us/innovations/case-studies/19/idt-lowers-cost-of-test-using-the-ni-semiconductor-test-system.html
Keeping pace with continuously increasing test performance requirements in a fast moving environment where device performance is constantly pushing the limits of ATE system capabilities and thereby accelerating ...

ST-Ericsson Reduces Semiconductor Test Time by 10X With LabVIEW and NI PXI RF Tools https://www.ni.com/en-us/innovations/case-studies/19/st-ericsson-reduces-semiconductor-test-time-by-10x-with-labview.html
Upgrading a characterization lab with a flexible validation test solution that could meet a variety of RF standards for semiconductor chip tests.