Search Results

Showing 1-10 of 210 results
Digital Transformation: Leveraging Test and Measurement to Accelerate Success https://www.ni.com/video/4590/en/
Aerospace and defense companies are pursuing digital transformation initiatives to deliver sophisticated systems and capabilities in an increasingly complex business environment. Learn how to leverage ...

Testing Next-Generation Inverters for Vehicle Traction Applications Webinar https://www.ni.com/webcast/4576/en/
Wide-bandgap semiconductor devices provide power electronics system designers with many advantages over traditional silicon (Si) solutions including higher voltage capability, lower losses, and higher ...

Use Simulation and Model-Based Control to Bring Test Earlier in the Design Cycle – European Version https://www.ni.com/webcast/4566/en/
Learn what test technology is needed to realize the substantial cost and time savings associated with bringing test earlier in the design cycle and moving from the field to the lab.

Standardize on a Platform-based Test Architecture – European Version https://www.ni.com/webcast/4567/en/
Learn why developing a common test architecture using a platform-based approach to test results in faster test development, more test coverage, better asset utilization, and more nimble teams.

DC Measurement Semiconductor Test Best Practices Webinar https://www.ni.com/webcast/4565/en/
DC measurements are pervasive throughout semiconductor characterization, validation, and production, regardless of specific device-under-test functionality. Parasitic loading, noise, and drift challenges ...

Use Simulation and Model-Based Control to Bring Test Earlier in the Design Cycle https://www.ni.com/webcast/4557/en/
Learn what test technology is needed to realize the substantial cost and time savings associated with bringing test earlier in the design cycle and moving from the field to the lab.

Standardize on a Platform-based Test Architecture https://www.ni.com/webcast/4559/en/
Learn why developing a common test architecture using a platform-based approach to test results in faster test development, more test coverage, better asset utilization, and more nimble teams.

4 Things You Should Know to Future-Proof an Electromechanical Test System https://www.ni.com/webcast/4544/en/
Working in aerospace and defense means long-term support of testers over decades-long programs. Whether you are fixing inherited problems or designing a test strategy for a new program, using a future-proof ...

Complete HIL Solutions with NI SLSC https://www.ni.com/video/4541/en/
Bloomy, an NI Alliance Partner, combines NI’s open platform with Bloomy’s HIL domain expertise to deliver complete systems to customers that are tailored to unique test requirements. Using NI SLSC, an ...

Standardizing the HIL Signal Path with SLSC https://www.ni.com/video/4451/en/
For years, test engineers have taken advantage of the lower price, outsourced risk, and easy upgradability of commercial off-the-shelf (COTS) components for their data acquisition. Until now, however, ...